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Zero-Error Systems

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Zero-Error Systems
ENSURING POWER RELIABILITY & DATA INTEGRITY IN ALL OPERATING ENVIRONMENTS

Zero-Error Systems (ZES) provides high-reliability semiconductor integrated circuits (ICs) and reliability testing services that enable higher functionality, lower cost, longer lifetime and higher power efficiency for space, automotive, aviation, robotics, IoT and other applications.

Errors in computing due to disruption of the logic state of a digital circuit occur both in space and on earth as ionized particles are always present. Studies also show that the most common reason for space mission failures is related to lack of reliable power management. In addition, most state-of-the-art Commercial-Off-The-Shelf (COTS) semiconductor devices are not designed to work in space environments; they suffer permanent system damage with heavy ion strikes.

Based on many years of deep tech research, ZES has created concrete proprietary solutions implemented in semiconductor and system designs, to address these challenges, be it on earth or in space.

ZES technologies are based on an innovative portfolio of patents in power management, reduction of error rates in computing and radiation protection for COTS semiconductor devices developed by a group of digital and analogue experts from Nanyang Technological University Singapore over a decade of research.

Solutions & Services

Latchup Detection and Protection (LDAP)
ZES’ Monolithic Radiation-Hardened LDAP IC detects and protects COTS ICs against Single Event Latchup (SEL). Based on ZES’ proprietary Radiation-Hardened By Design (RHBD) and LDAP technologies, it enables advanced COTS ICs to be deployed for space applications.
Power Management
ZES power management solutions can achieve more than 90% power efficiency during active and sleep modes. ZES solution is the first in the market to incorporate innate redundancy to ensure power reliability yet remain low cost.
Radiation Hardened by Design (RHBD) Library Cells
ZES RHBD library cells can achieve ultra-low soft-error (ULSE) (such as ~10 FITs, i.e., ~10 errors per billion hours of operation) with low Power x Delay x Area to ensure system data integrity. A low power solution increases operating life and reliability of the system, while low delay increases processing capability and small area offers more utilization per unit area.
In this video, host Frank Felker of The SmallSat Revolution Podcast interviews Dr. Wei Shu, CTO and cofounder of Zero Error Systems, who explains his company’s proprietary method of radiation hardening for spacecraft components.

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